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1 Ergebnisse
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Highly Reliable 4H-SiC Epitaxial Wafer with BPD Free Recomb..:
Itoh, Hironori
;
Enokizono, Taro
;
Miyase, Takaya
...
Materials Science Forum. 1004 (2020) - p. 71-77 , 2020
Link:
https://doi.org/10.4028/www.scientific.net/msf.1004.71
RT Journal T1
Highly Reliable 4H-SiC Epitaxial Wafer with BPD Free Recombination-Enhancing Buffer Layer for High Current Applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.1004.71&Exemplar=1&LAN=DE A1 Itoh, Hironori A1 Enokizono, Taro A1 Miyase, Takaya A1 Hori, Tsutomu A1 Wada, Keiji A1 Doi, Hideyuki A1 Furumai, Masaki PB Trans Tech Publications, Ltd. YR 2020 SN 1662-9752 JF Materials Science Forum VO 1004 SP 71 OP 77 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.1004.71 DO https://doi.org/10.4028/www.scientific.net/msf.1004.71 SF ELIB - SuUB Bremen
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