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1 Ergebnisse
1
New Opportunities in X-Ray Texture Analysis of two Phase Ti..:
Bermig, G.
;
Tobisch, J.
;
Richter, K.
.
Materials Science Forum. 133-136 (1993) - p. 163-168 , 1993
Link:
https://doi.org/10.4028/www.scientific.net/msf.133-136..
RT Journal T1
New Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF Reproduction
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.133-136.163&Exemplar=1&LAN=DE A1 Bermig, G. A1 Tobisch, J. A1 Richter, K. A1 Helming, Kurt PB Trans Tech Publications, Ltd. YR 1993 SN 1662-9752 JF Materials Science Forum VO 133-136 SP 163 OP 168 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.133-136.163 DO https://doi.org/10.4028/www.scientific.net/msf.133-136.163 SF ELIB - SuUB Bremen
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