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Investigation into Short-Circuit Ruggedness of 1.2 kV 4H-Si..:

Nakao, Yukiyasu ; Watanabe, Shoyu ; Miura, Naruhisa..
Materials Science Forum.  600-603 (2008)  - p. 1123-1126 , 2008
Link: https://doi.org/10.4028/www.scientific.net/msf.600-603..