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1 Ergebnisse
1
New Lines and Issues Associated with Deep Defect Spectra in..:
Yan, Fei
;
Devaty, Robert P.
;
Choyke, Wolfgang J.
...
Materials Science Forum. 645-648 (2010) - p. 411-414 , 2010
Link:
https://doi.org/10.4028/www.scientific.net/msf.645-648..
RT Journal T1
New Lines and Issues Associated with Deep Defect Spectra in Electron, Proton and 4He Ion Irradiated 4H SiC
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.645-648.411&Exemplar=1&LAN=DE A1 Yan, Fei A1 Devaty, Robert P. A1 Choyke, Wolfgang J. A1 Kimoto, Tsunenobu A1 Ohshima, Takeshi A1 Pensl, Gerhard A1 Gali, Adam PB Trans Tech Publications, Ltd. YR 2010 SN 1662-9752 JF Materials Science Forum VO 645-648 SP 411 OP 414 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.645-648.411 DO https://doi.org/10.4028/www.scientific.net/msf.645-648.411 SF ELIB - SuUB Bremen
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