I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Thermal Histories of Defect Centers as Measured by Low Temp..:
Yan, Fei
;
Devaty, Robert P.
;
Choyke, Wolfgang J.
...
Materials Science Forum. 645-648 (2010) - p. 419-422 , 2010
Link:
https://doi.org/10.4028/www.scientific.net/msf.645-648..
RT Journal T1
Thermal Histories of Defect Centers as Measured by Low Temperature Photoluminescence in n- and p-Type 4H SiC Epilayers Generated by Irradiation with 170 keV or 1 MeV Electrons
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.645-648.419&Exemplar=1&LAN=DE A1 Yan, Fei A1 Devaty, Robert P. A1 Choyke, Wolfgang J. A1 Danno, Katsunori A1 Alfieri, Giovanni A1 Kimoto, Tsunenobu A1 Onoda, Shinobu A1 Ohshima, Takeshi A1 Reshanov, Sergey A. A1 Beljakowa, Svetlana A1 Zippelius, Bernd A1 Pensl, Gerhard PB Trans Tech Publications, Ltd. YR 2010 SN 1662-9752 JF Materials Science Forum VO 645-648 SP 419 OP 422 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.645-648.419 DO https://doi.org/10.4028/www.scientific.net/msf.645-648.419 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)