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1 Ergebnisse
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Evaluation of PBTS and NBTS in SiC MOS Using In Situ Charge..:
Habersat, Daniel B.
;
Lelis, Aivars J.
;
Green, Ronald
.
Materials Science Forum. 740-742 (2013) - p. 545-548 , 2013
Link:
https://doi.org/10.4028/www.scientific.net/msf.740-742..
RT Journal T1
Evaluation of PBTS and NBTS in SiC MOS Using In Situ Charge Pumping Measurements
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.740-742.545&Exemplar=1&LAN=DE A1 Habersat, Daniel B. A1 Lelis, Aivars J. A1 Green, Ronald A1 El, Mooro PB Trans Tech Publications, Ltd. YR 2013 SN 1662-9752 JF Materials Science Forum VO 740-742 SP 545 OP 548 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.740-742.545 DO https://doi.org/10.4028/www.scientific.net/msf.740-742.545 SF ELIB - SuUB Bremen
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