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1 Ergebnisse
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Electrical Characterization of PiN Diodes with p+ Layer Sel..:
Thierry-Jebali, Nicolas
;
Lazar, Mihai
;
Vo-Ha, Arthur
...
Materials Science Forum. 740-742 (2013) - p. 911-914 , 2013
Link:
https://doi.org/10.4028/www.scientific.net/msf.740-742..
RT Journal T1
Electrical Characterization of PiN Diodes with p+ Layer Selectively Grown by VLS Transport
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.740-742.911&Exemplar=1&LAN=DE A1 Thierry-Jebali, Nicolas A1 Lazar, Mihai A1 Vo-Ha, Arthur A1 Carole, Davy A1 Soulière, Véronique A1 Laariedh, Farah A1 Hassan, Jawad A1 Henry, Anne A1 Janzén, Erik A1 Planson, Dominique A1 Ferro, Gabriel A1 Brylinski, Christian A1 Brosselard, Pierre PB Trans Tech Publications, Ltd. YR 2013 SN 1662-9752 JF Materials Science Forum VO 740-742 SP 911 OP 914 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.740-742.911 DO https://doi.org/10.4028/www.scientific.net/msf.740-742.911 SF ELIB - SuUB Bremen
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