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1 Ergebnisse
1
Effect of Current-Spreading Layer Formed by Ion Implantatio..:
Deguchi, Tadayoshi
;
Katakami, Shuji
;
Fujisawa, Hiroyuki
...
Materials Science Forum. 778-780 (2014) - p. 1038-1041 , 2014
Link:
https://doi.org/10.4028/www.scientific.net/msf.778-780..
RT Journal T1
Effect of Current-Spreading Layer Formed by Ion Implantation on the Electrical Properties of High-Voltage 4H-SiC p-Channel IGBTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.778-780.1038&Exemplar=1&LAN=DE A1 Deguchi, Tadayoshi A1 Katakami, Shuji A1 Fujisawa, Hiroyuki A1 Takenaka, Kensuke A1 Ishimori, Hitoshi A1 Takasu, Shinji A1 Takei, Manabu A1 Arai, Manabu A1 Yonezawa, Yoshiyuki A1 Fukuda, Kenji A1 Okumura, Hajime PB Trans Tech Publications, Ltd. YR 2014 SN 1662-9752 JF Materials Science Forum VO 778-780 SP 1038 OP 1041 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.778-780.1038 DO https://doi.org/10.4028/www.scientific.net/msf.778-780.1038 SF ELIB - SuUB Bremen
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