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1 Ergebnisse
1
Structure and Origin of Carrot Defects on 4H-SiC Homoepitax..:
Dong, Lin
;
Sun, Guo Sheng
;
Yu, Jun
...
Materials Science Forum. 778-780 (2014) - p. 354-357 , 2014
Link:
https://doi.org/10.4028/www.scientific.net/msf.778-780..
RT Journal T1
Structure and Origin of Carrot Defects on 4H-SiC Homoepitaxial Layers
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.778-780.354&Exemplar=1&LAN=DE A1 Dong, Lin A1 Sun, Guo Sheng A1 Yu, Jun A1 Yan, Guo Guo A1 Zhao, Wan Shun A1 Wang, Lei A1 Zhang, Xin He A1 Li, Xi Guang A1 Wang, Zhan Guo PB Trans Tech Publications, Ltd. YR 2014 SN 1662-9752 JF Materials Science Forum VO 778-780 SP 354 OP 357 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.778-780.354 DO https://doi.org/10.4028/www.scientific.net/msf.778-780.354 SF ELIB - SuUB Bremen
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