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1 Ergebnisse
1
Low Energy Proton Radiation Impact on 4H-SiC nMOSFET Gate O..:
Florentin, Matthieu
;
Alexandru, Mihaela
;
Constant, Aurore
...
Materials Science Forum. 778-780 (2014) - p. 525-528 , 2014
Link:
https://doi.org/10.4028/www.scientific.net/msf.778-780..
RT Journal T1
Low Energy Proton Radiation Impact on 4H-SiC nMOSFET Gate Oxide Stability
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.778-780.525&Exemplar=1&LAN=DE A1 Florentin, Matthieu A1 Alexandru, Mihaela A1 Constant, Aurore A1 Schmidt, Bernd A1 Millan, José A1 Godignon, Philippe PB Trans Tech Publications, Ltd. YR 2014 SN 1662-9752 JF Materials Science Forum VO 778-780 SP 525 OP 528 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.778-780.525 DO https://doi.org/10.4028/www.scientific.net/msf.778-780.525 SF ELIB - SuUB Bremen
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