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1 Ergebnisse
1
Effect of Fixed Oxide Charges and Donor-Like Interface Trap..:
Yen, Cheng Tyng
;
Hung, Hsiang Ting
;
Hung, Chien Chung
...
Materials Science Forum. 821-823 (2015) - p. 729-732 , 2015
Link:
https://doi.org/10.4028/www.scientific.net/msf.821-823..
RT Journal T1
Effect of Fixed Oxide Charges and Donor-Like Interface Traps on the Breakdown Voltage of SiC Devices with FGR and JTE Terminations
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.821-823.729&Exemplar=1&LAN=DE A1 Yen, Cheng Tyng A1 Hung, Hsiang Ting A1 Hung, Chien Chung A1 Lee, Chwan Ying A1 Lee, Lurng Shehng A1 Huang, Yao Feng A1 Yang, Tzu Ming A1 Cheng, Chi Yin PB Trans Tech Publications, Ltd. YR 2015 SN 1662-9752 JF Materials Science Forum VO 821-823 SP 729 OP 732 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.821-823.729 DO https://doi.org/10.4028/www.scientific.net/msf.821-823.729 SF ELIB - SuUB Bremen
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