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1 Ergebnisse
1
Low Energy Electron Channeling Contrast Imaging from 4H-SiC..:
Ashida, Koji
;
Aiso, Toru
;
Okamoto, Manabu
...
Materials Science Forum. 897 (2017) - p. 193-196 , 2017
Link:
https://doi.org/10.4028/www.scientific.net/msf.897.193
RT Journal T1
Low Energy Electron Channeling Contrast Imaging from 4H-SiC Surface by SEM and its Comparison with CDIC-OM and PL Imaging
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.897.193&Exemplar=1&LAN=DE A1 Ashida, Koji A1 Aiso, Toru A1 Okamoto, Manabu A1 Seki, Hirokazu A1 Kitabatake, Makoto A1 Kaneko, Tadaaki PB Trans Tech Publications, Ltd. YR 2017 SN 1662-9752 JF Materials Science Forum VO 897 SP 193 OP 196 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.897.193 DO https://doi.org/10.4028/www.scientific.net/msf.897.193 SF ELIB - SuUB Bremen
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