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Immobilization Phenomenon of Partials Surrounding Double Sh..:
Sugiyama, Naohiro
;
Suo, Hiromasa
;
Eto, Kazuma
...
Materials Science Forum. 924 (2018) - p. 160-163 , 2018
Link:
https://doi.org/10.4028/www.scientific.net/msf.924.160
RT Journal T1 <Title>Immobilization Phenomenon of Partials Surrounding Double Shockley Stacking Faults in Heavily Nitrogen Doped 4H-SiC Crystal with Thermal Anneal</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.924.160&Exemplar=1&LAN=DE A1 Sugiyama, Naohiro A1 Suo, Hiromasa A1 Eto, Kazuma A1 Tokuda, Yuichiro A1 Kamata, Isaho A1 Hoshino, Norihiro A1 Kato, Tomohisa A1 Tsuchida, Hidekazu A1 Okumura, Hajime PB Trans Tech Publications, Ltd. YR 2018 SN 1662-9752 JF Materials Science Forum VO 924 SP 160 OP 163 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.924.160 DO https://doi.org/10.4028/www.scientific.net/msf.924.160 SF ELIB - SuUB Bremen
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