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1 Ergebnisse
1
Reliability and Ruggedness of 1200V SiC Planar Gate MOSFETs..:
Chowdhury, Sauvik
;
Gant, Levi
;
Powell, Blake
..
Materials Science Forum. 924 (2018) - p. 697-702 , 2018
Link:
https://doi.org/10.4028/www.scientific.net/msf.924.697
RT Journal T1
Reliability and Ruggedness of 1200V SiC Planar Gate MOSFETs Fabricated in a High Volume CMOS Foundry
UL https://suche.suub.uni-bremen.de/peid=cr-10.4028_www.scientific.net_msf.924.697&Exemplar=1&LAN=DE A1 Chowdhury, Sauvik A1 Gant, Levi A1 Powell, Blake A1 Rangaswamy, Kasturirangan A1 Matocha, Kevin PB Trans Tech Publications, Ltd. YR 2018 SN 1662-9752 JF Materials Science Forum VO 924 SP 697 OP 702 LK http://dx.doi.org/https://doi.org/10.4028/www.scientific.net/msf.924.697 DO https://doi.org/10.4028/www.scientific.net/msf.924.697 SF ELIB - SuUB Bremen
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