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Investigation of Occupational EMF Exposure Assessment Syste:
Jeon, Sang Bong
;
Lee, Ae-Kyoung
;
Kwon, Yong-Ki
...
The Journal of Korean Institute of Electromagnetic Engineering and Science. 28 (2017) 11 - p. 843-852 , 2017
Link:
https://doi.org/10.5515/kjkiees.2017.28.11.843
RT Journal T1 <Title>Investigation of Occupational EMF Exposure Assessment System</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.5515_kjkiees.2017.28.11.843&Exemplar=1&LAN=DE A1 Jeon, Sang Bong A1 Lee, Ae-Kyoung A1 Kwon, Yong-Ki A1 Jang, Ju-Dong A1 An, Juno A1 Pack, Jeong-Ki A1 Gimm, Youn-Myoung A1 Choi, Hyung-Do PB Korean Institute of Electromagnetic Engineering and Science YR 2017 SN 1226-3133 SN 2288-226X JF The Journal of Korean Institute of Electromagnetic Engineering and Science VO 28 IS 11 SP 843 OP 852 LK http://dx.doi.org/https://doi.org/10.5515/kjkiees.2017.28.11.843 DO https://doi.org/10.5515/kjkiees.2017.28.11.843 SF ELIB - SuUB Bremen
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