I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
DC and RF Characteristics of 100-nm mHEMT Devices Fabricate..:
Yoon, Hyung Sup
;
Min, Byoung-Gue
;
Chang, Sung-Jae
...
The Journal of Korean Institute of Electromagnetic Engineering and Science. 30 (2019) 4 - p. 282-285 , 2019
Link:
https://doi.org/10.5515/kjkiees.2019.30.4.282
RT Journal T1 <Title>DC and RF Characteristics of 100-nm mHEMT Devices Fabricated with a Two-Step Gate Recess</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.5515_kjkiees.2019.30.4.282&Exemplar=1&LAN=DE A1 Yoon, Hyung Sup A1 Min, Byoung-Gue A1 Chang, Sung-Jae A1 Jung, Hyun-Wook A1 Lee, Jong Min A1 Kim, Seong-Il A1 Chang, Woo-Jin A1 Kang, Dong Min A1 Lim, Jong Won A1 Kim, Wansik A1 Jung, Jooyong A1 Kim, Jongpil A1 Seo, Mihui A1 Kim, Sosu PB Korean Institute of Electromagnetic Engineering and Science YR 2019 SN 1226-3133 SN 2288-226X JF The Journal of Korean Institute of Electromagnetic Engineering and Science VO 30 IS 4 SP 282 OP 285 LK http://dx.doi.org/https://doi.org/10.5515/kjkiees.2019.30.4.282 DO https://doi.org/10.5515/kjkiees.2019.30.4.282 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
