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1 Ergebnisse
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Scanning Gate Microscopic Investigation of Graphene Nanorib..:
Jang, Seo Gyun
;
Gwon, Oh Hun
;
Shin, BeomKyu
..
Applied Science and Convergence Technology. 33 (2024) 2 - p. 50-52 , 2024
Link:
https://doi.org/10.5757/asct.2024.33.2.50
RT Journal T1 <Title>Scanning Gate Microscopic Investigation of Graphene Nanoribbon Underneath Dielectric Layer</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.5757_asct.2024.33.2.50&Exemplar=1&LAN=DE A1 Jang, Seo Gyun A1 Gwon, Oh Hun A1 Shin, BeomKyu A1 Ryu, Daehyun A1 Yu, Young-Jun PB The Korean Vacuum Society YR 2024 SN 2288-6559 JF Applied Science and Convergence Technology VO 33 IS 2 SP 50 OP 52 LK http://dx.doi.org/https://doi.org/10.5757/asct.2024.33.2.50 DO https://doi.org/10.5757/asct.2024.33.2.50 SF ELIB - SuUB Bremen
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