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1 Ergebnisse
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DESIGN AND DEVELOPMENT OF ENHANCED MEMORY RELIABILITY AGAIN..:
Singh, S Gurudas
;
Kumar, R Arun
Turkish Journal of Computer and Mathematics Education (TURCOMAT). 10 (2019) 3 - p. 1620-1628 , 2019
Link:
https://doi.org/10.61841/turcomat.v10i3.14579
RT Journal T1 <Title>DESIGN AND DEVELOPMENT OF ENHANCED MEMORY RELIABILITY AGAINST MULTIPLE CELL UPSETS USING DMC</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.61841_turcomat.v10i3.14579&Exemplar=1&LAN=DE A1 Singh, S Gurudas A1 Kumar, R Arun PB Ninety Nine Publication YR 2019 SN 1309-4653 JF Turkish Journal of Computer and Mathematics Education (TURCOMAT) VO 10 IS 3 SP 1620 OP 1628 LK http://dx.doi.org/https://doi.org/10.61841/turcomat.v10i3.14579 DO https://doi.org/10.61841/turcomat.v10i3.14579 SF ELIB - SuUB Bremen
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