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1 Ergebnisse
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Reliability improvement of pad-extended on chip light-emitt..:
Su, Shui-Hsiang
;
Chang, Ming
;
Chen, Yu-Chung
...
Japanese Journal of Applied Physics. 58 (2018) SA - p. SAAD01 , 2018
Link:
https://doi.org/10.7567/1347-4065/aaec84
RT Journal T1
Reliability improvement of pad-extended on chip light-emitting diodes using an ultra-thin passivation layer
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_1347-4065_aaec84&Exemplar=1&LAN=DE A1 Su, Shui-Hsiang A1 Chang, Ming A1 Chen, Yu-Chung A1 Tseng, Chun-Lung A1 Shen, Ching-Hsing A1 Tseng, Chin-Ming PB IOP Publishing YR 2018 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 58 IS SA SP SAAD01 LK http://dx.doi.org/https://doi.org/10.7567/1347-4065/aaec84 DO https://doi.org/10.7567/1347-4065/aaec84 SF ELIB - SuUB Bremen
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