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Impact of crystal faces of 4H-SiC in SiO2/4H-SiC structures..:
Hatakeyama, Tetsuo
;
Masuda, Takeyoshi
;
Sometani, Mitsuru
...
Applied Physics Express. 12 (2019) 2 - p. 021003 , 2019
Link:
https://doi.org/10.7567/1882-0786/aaf283
RT Journal T1
Impact of crystal faces of 4H-SiC in SiO2/4H-SiC structures on interface trap densities and mobilities
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_1882-0786_aaf283&Exemplar=1&LAN=DE A1 Hatakeyama, Tetsuo A1 Masuda, Takeyoshi A1 Sometani, Mitsuru A1 Harada, Shinsuke A1 Okamoto, Dai A1 Yano, Hiroshi A1 Yonezawa, Yoshiyuki A1 Okumura, Hajime PB IOP Publishing YR 2019 SN 1882-0778 SN 1882-0786 JF Applied Physics Express VO 12 IS 2 SP 021003 LK http://dx.doi.org/https://doi.org/10.7567/1882-0786/aaf283 DO https://doi.org/10.7567/1882-0786/aaf283 SF ELIB - SuUB Bremen
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