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1 Ergebnisse
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Microstructural Characterization in Reliability Measurement..:
Bae, Junsoo
;
Hwang, Kyuman
;
Park, Kwangho
...
Japanese Journal of Applied Physics. 50 (2011) 4S - p. 04DD12 , 2011
Link:
https://doi.org/10.7567/jjap.50.04dd12
RT Journal T1 <Title>Microstructural Characterization in Reliability Measurement of Phase Change Random Access Memory</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.50.04dd12&Exemplar=1&LAN=DE A1 Bae, Junsoo A1 Hwang, Kyuman A1 Park, Kwangho A1 Jeon, Seongbu A1 Kang, Dae-hwan A1 Park, Soonoh A1 Ahn, Juhyeon A1 Kim, Seoksik A1 Jeong, Gitae A1 Chung, Chilhee PB IOP Publishing YR 2011 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 50 IS 4S SP 04DD12 LK http://dx.doi.org/https://doi.org/10.7567/jjap.50.04dd12 DO https://doi.org/10.7567/jjap.50.04dd12 SF ELIB - SuUB Bremen
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