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1 Ergebnisse
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High-Frequency Capacitance–Voltage Characteristics of N-Typ..:
Wang, Bin
;
Zhang, He-Ming
;
Hu, Hui-Yong
...
Japanese Journal of Applied Physics. 52 (2013) 6R - p. 064201 , 2013
Link:
https://doi.org/10.7567/jjap.52.064201
RT Journal T1 <Title>High-Frequency Capacitance–Voltage Characteristics of N-Type Metal–Oxide–Semiconductor Capacitor Based on Strained-Si/SiGe Architecture</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.52.064201&Exemplar=1&LAN=DE A1 Wang, Bin A1 Zhang, He-Ming A1 Hu, Hui-Yong A1 Shu, Bin A1 Zhang, Yu-Ming A1 Song, Jian-Jun PB IOP Publishing YR 2013 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 52 IS 6R SP 064201 LK http://dx.doi.org/https://doi.org/10.7567/jjap.52.064201 DO https://doi.org/10.7567/jjap.52.064201 SF ELIB - SuUB Bremen
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