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1 Ergebnisse
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Quantification of Nitrogen in Silicon by Luminescence Activ..:
Tajima, Michio
;
Kamata, Yohei
Japanese Journal of Applied Physics. 52 (2013) 8R - p. 086602 , 2013
Link:
https://doi.org/10.7567/jjap.52.086602
RT Journal T1 <Title>Quantification of Nitrogen in Silicon by Luminescence Activation Using Aluminum Ion Implantation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.52.086602&Exemplar=1&LAN=DE A1 Tajima, Michio A1 Kamata, Yohei PB IOP Publishing YR 2013 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 52 IS 8R SP 086602 LK http://dx.doi.org/https://doi.org/10.7567/jjap.52.086602 DO https://doi.org/10.7567/jjap.52.086602 SF ELIB - SuUB Bremen
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