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1 Ergebnisse
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Annealing influence on recovery of electrically stressed po..:
Djorić-Veljković, Snežana
;
Manić, Ivica
;
Davidović, Vojkan
...
Japanese Journal of Applied Physics. 54 (2015) 6 - p. 064101 , 2015
Link:
https://doi.org/10.7567/jjap.54.064101
RT Journal T1
Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.54.064101&Exemplar=1&LAN=DE A1 Djorić-Veljković, Snežana A1 Manić, Ivica A1 Davidović, Vojkan A1 Danković, Danijel A1 Golubović, Snežana A1 Stojadinović, Ninoslav PB IOP Publishing YR 2015 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 54 IS 6 SP 064101 LK http://dx.doi.org/https://doi.org/10.7567/jjap.54.064101 DO https://doi.org/10.7567/jjap.54.064101 SF ELIB - SuUB Bremen
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