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1 Ergebnisse
1
Improved linearity and reliability in GaN metal–oxide–semic..:
Hsu, Ching-Hsiang
;
Shih, Wang-Cheng
;
Lin, Yueh-Chin
...
Japanese Journal of Applied Physics. 55 (2016) 4S - p. 04EG04 , 2016
Link:
https://doi.org/10.7567/jjap.55.04eg04
RT Journal T1
Improved linearity and reliability in GaN metal–oxide–semiconductor high-electron-mobility transistors using nanolaminate La2O3/SiO2 gate dielectric
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.55.04eg04&Exemplar=1&LAN=DE A1 Hsu, Ching-Hsiang A1 Shih, Wang-Cheng A1 Lin, Yueh-Chin A1 Hsu, Heng-Tung A1 Hsu, Hisang-Hua A1 Huang, Yu-Xiang A1 Lin, Tai-Wei A1 Wu, Chia-Hsun A1 Wu, Wen-Hao A1 Maa, Jer-Shen A1 Iwai, Hiroshi A1 Kakushima, Kuniyuki A1 Chang, Edward Yi PB IOP Publishing YR 2016 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 55 IS 4S SP 04EG04 LK http://dx.doi.org/https://doi.org/10.7567/jjap.55.04eg04 DO https://doi.org/10.7567/jjap.55.04eg04 SF ELIB - SuUB Bremen
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