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1 Ergebnisse
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Interface stability of electrode/Bi-containing relaxor ferr..:
Nagata, Takahiro
;
Kumaragurubaran, Somu
;
Tsunekawa, Yoshifumi
...
Japanese Journal of Applied Physics. 55 (2016) 6S1 - p. 06GJ12 , 2016
Link:
https://doi.org/10.7567/jjap.55.06gj12
RT Journal T1
Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.55.06gj12&Exemplar=1&LAN=DE A1 Nagata, Takahiro A1 Kumaragurubaran, Somu A1 Tsunekawa, Yoshifumi A1 Yamashita, Yoshiyuki A1 Ueda, Shigenori A1 Takahashi, Kenichiro A1 Ri, Sung-Gi A1 Suzuki, Setsu A1 Oh, Seungjun A1 Chikyow, Toyohiro PB IOP Publishing YR 2016 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 55 IS 6S1 SP 06GJ12 LK http://dx.doi.org/https://doi.org/10.7567/jjap.55.06gj12 DO https://doi.org/10.7567/jjap.55.06gj12 SF ELIB - SuUB Bremen
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