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1 Ergebnisse
1
Suppression of endurance degradation by applying constant v..:
Su, Yu-Ting
;
Chang, Ting-Chang
;
Tsai, Tsung-Ming
...
Japanese Journal of Applied Physics. 56 (2016) 1 - p. 010303 , 2016
Link:
https://doi.org/10.7567/jjap.56.010303
RT Journal T1
Suppression of endurance degradation by applying constant voltage stress in one-transistor and one-resistor resistive random access memory
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.56.010303&Exemplar=1&LAN=DE A1 Su, Yu-Ting A1 Chang, Ting-Chang A1 Tsai, Tsung-Ming A1 Chang, Kuan-Chang A1 Chu, Tian-Jian A1 Chen, Hsin-Lu A1 Chen, Min-Chen A1 Yang, Chih-Cheng A1 Huang, Hui-Chun A1 Lo, Ikai A1 Zheng, Jin-Cheng A1 Sze, Simon M. PB IOP Publishing YR 2016 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 56 IS 1 SP 010303 LK http://dx.doi.org/https://doi.org/10.7567/jjap.56.010303 DO https://doi.org/10.7567/jjap.56.010303 SF ELIB - SuUB Bremen
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