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Near-field light detection of a photo induced force by atom..:
Satoh, Nobuo
;
Kobayashi, Kei
;
Matsushige, Kazumi
.
Japanese Journal of Applied Physics. 56 (2017) 8S1 - p. 08LB03 , 2017
Link:
https://doi.org/10.7567/jjap.56.08lb03
RT Journal T1
Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.56.08lb03&Exemplar=1&LAN=DE A1 Satoh, Nobuo A1 Kobayashi, Kei A1 Matsushige, Kazumi A1 Yamada, Hirofumi PB IOP Publishing YR 2017 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 56 IS 8S1 SP 08LB03 LK http://dx.doi.org/https://doi.org/10.7567/jjap.56.08lb03 DO https://doi.org/10.7567/jjap.56.08lb03 SF ELIB - SuUB Bremen
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