I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Degradation process by effect of water molecules during neg..:
Lee, Yeol-Hyeong
;
Cho, Yong-Jung
;
Kim, Woo-Sic
...
Japanese Journal of Applied Physics. 56 (2017) 10 - p. 108001 , 2017
Link:
https://doi.org/10.7567/jjap.56.108001
RT Journal T1
Degradation process by effect of water molecules during negative bias temperature stress in amorphous-InGaZnO thin-film transistor
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.56.108001&Exemplar=1&LAN=DE A1 Lee, Yeol-Hyeong A1 Cho, Yong-Jung A1 Kim, Woo-Sic A1 Park, Jeong Ki A1 Kim, Geon Tae A1 Kim, Ohyun PB IOP Publishing YR 2017 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 56 IS 10 SP 108001 LK http://dx.doi.org/https://doi.org/10.7567/jjap.56.108001 DO https://doi.org/10.7567/jjap.56.108001 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)