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Analysis of defects in low-temperature polycrystalline sili..:
Kitahara, Kuninori
;
Yeh, Wenchang
;
Hara, Akito
Japanese Journal of Applied Physics. 57 (2017) 1 - p. 011401 , 2017
Link:
https://doi.org/10.7567/jjap.57.011401
RT Journal T1
Analysis of defects in low-temperature polycrystalline silicon thin films related to surface-enhanced Raman scattering
UL https://suche.suub.uni-bremen.de/peid=cr-10.7567_jjap.57.011401&Exemplar=1&LAN=DE A1 Kitahara, Kuninori A1 Yeh, Wenchang A1 Hara, Akito PB IOP Publishing YR 2017 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 57 IS 1 SP 011401 LK http://dx.doi.org/https://doi.org/10.7567/jjap.57.011401 DO https://doi.org/10.7567/jjap.57.011401 SF ELIB - SuUB Bremen
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