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1 Ergebnisse
1
Analysis of the Formation Mechanism of Short Circuit Marks:
Kim, Sun Jae
;
Choi, Gyeong Won
;
Gong, Young Soo
...
Fire Science and Engineering. 37 (2023) 1 - p. 100-105 , 2023
Link:
https://doi.org/10.7731/kifse.b99e7ad5
RT Journal T1
Analysis of the Formation Mechanism of Short Circuit Marks
UL https://suche.suub.uni-bremen.de/peid=cr-10.7731_kifse.b99e7ad5&Exemplar=1&LAN=DE A1 Kim, Sun Jae A1 Choi, Gyeong Won A1 Gong, Young Soo A1 Moon, Byung Sun A1 Cho, Young Jin A1 Lim, Kyu Young PB Korea Institute of Fire Science and Engineering YR 2023 SN 2765-060X SN 2765-088X JF Fire Science and Engineering VO 37 IS 1 SP 100 OP 105 LK http://dx.doi.org/https://doi.org/10.7731/kifse.b99e7ad5 DO https://doi.org/10.7731/kifse.b99e7ad5 SF ELIB - SuUB Bremen
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