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Cross-layer reliability of computing systems
IET materials, circuits and devices series, 57
Di Natale, Giorgio
;
Gizopoulos, Dimitris
;
Di Carlo, Stefano
.. , 2020
Link:
https://search.ebscohost.com/login.aspx?direct=true&sc..
RT T1
Cross-layer reliability of computing systems
UL https://suche.suub.uni-bremen.de/peid=ebsco-2578812&Exemplar=1&LAN=DE A1 Di Natale, Giorgio A1 Gizopoulos, Dimitris A1 Di Carlo, Stefano A1 Bosio, Alberto A1 Canal, Ramon PB The Institution of Engineering and Technology YR 2020 NO xi, 315 T3 IET materials, circuits and devices series, 57 SN 1785617982 SN 9781785617980 SN 9781785617973 SN 1785617974 K1 Computer architecture K1 Stochastic processes K1 Stochastic Processes K1 Ordinateurs K1 Processus stochastiques K1 computer architecture K1 fault tolerant computing K1 instruction sets K1 multiprocessing systems K1 stochastic processes K1 Architecture LK http://dx.doi.org/https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2578812 DO https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2578812 SF ELIB - SuUB Bremen
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