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Electromigration in ULSI interconnections
International series on advances in solid state electronics and technology
Tan, Cher Ming
, 2010
Link:
https://search.ebscohost.com/login.aspx?direct=true&sc..
RT T1 <Title>Electromigration in ULSI interconnections</Title> UL https://suche.suub.uni-bremen.de/peid=ebsco-374811&Exemplar=1&LAN=DE A1 Tan, Cher Ming PB World Scientific Pub. Co YR 2010 NO xix, 291 T3 International series on advances in solid state electronics and technology SN 9789814273336 SN 9814273333 SN 9789814273329 SN 9814273325 K1 Integrated circuits K1 Electrodiffusion K1 Circuits intégrés à ultra-grande échelle K1 Électromigration K1 TECHNOLOGY & ENGINEERING K1 Ultra large scale integration K1 Electronics K1 Circuits K1 Integrated LK http://dx.doi.org/https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=374811 DO https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=374811 SF ELIB - SuUB Bremen
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