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1 Ergebnisse
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Defects-recognition imaging and physics in semiconductors X..
Materials science forum, v. 725
Yamada-Kaneta, Hiroshi
;
Sakai, Akira
, 2012
Link:
https://search.ebscohost.com/login.aspx?direct=true&sc..
RT T1
Defects-recognition imaging and physics in semiconductors XIV: selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
UL https://suche.suub.uni-bremen.de/peid=ebsco-517215&Exemplar=1&LAN=DE A1 Yamada-Kaneta, Hiroshi A1 Sakai, Akira PB Trans Tech Publications YR 2012 NO xiii, 299 T3 Materials science forum, v. 725 SN 9783038138563 SN 3038138568 SN 9783037854426 K1 Semiconductors K1 Image processing K1 Semi-conducteurs K1 Traitement d'images K1 TECHNOLOGY & ENGINEERING K1 Defects K1 Défauts K1 Electronics K1 Solid State LK http://dx.doi.org/https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=517215 DO https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=517215 SF ELIB - SuUB Bremen
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