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1 Ergebnisse
1
Multi-label dimensionality reduction
Chapman & Hall/CRC machine learning & pattern recognition series
Sun, Liang
;
Ji, Shuiwang
;
Ye, Jieping
, 2014
Link:
https://search.ebscohost.com/login.aspx?direct=true&sc..
RT T1
Multi-label dimensionality reduction
UL https://suche.suub.uni-bremen.de/peid=ebsco-668793&Exemplar=1&LAN=DE A1 Sun, Liang A1 Ji, Shuiwang A1 Ye, Jieping PB CRC Press YR 2014 T3 Chapman & Hall/CRC machine learning & pattern recognition series SN 9781439806166 SN 1439806160 SN 9781439806159 SN 1439806152 SN 9780429148200 SN 0429148208 K1 Dimension reduction (Statistics) K1 Dimensional analysis K1 Réduction de dimension (Statistique) K1 Analyse dimensionnelle K1 COMPUTERS LK http://dx.doi.org/https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=668793 DO https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=668793 SF ELIB - SuUB Bremen
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