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1 Ergebnisse
1
7th International Conference on Shallow-Level Centers in Se..:
Ammerlaan, C. A. J
;
Pajot, B
, 1997
Link:
https://search.ebscohost.com/login.aspx?direct=true&sc..
RT T1
7th International Conference on Shallow-Level Centers in Semiconductors: Amsterdam, the Netherlands, 17-19 July 1996
UL https://suche.suub.uni-bremen.de/peid=ebsco-942140&Exemplar=1&LAN=DE A1 Ammerlaan, C. A. J A1 Pajot, B PB World Scientific YR 1997 SN 9789814530262 SN 9814530263 SN 9810229283 SN 9789810229283 K1 Semiconductors K1 Impurity centers K1 Semi-conducteurs K1 TECHNOLOGY & ENGINEERING K1 Dotierter Halbleiter K1 Kongress K1 Halfgeleiders K1 Roosterfouten K1 Defects K1 Impurity distribution K1 Défauts K1 Diffusion des impuretés K1 Mechanical LK http://dx.doi.org/https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=942140 DO https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=942140 SF ELIB - SuUB Bremen
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