I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
International Conference on Silicon Carbide and Related Mat..
Scientific Books Collection, Vol. 56
Marek, Juraj
;
Pobegen, Gregor
;
Grossner, Ulrike
, 2023
Link:
https://search.ebscohost.com/login.aspx?direct=true&sc..
RT T1
International Conference on Silicon Carbide and Related Materials 2022
UL https://suche.suub.uni-bremen.de/peid=ebsco-oa-3622908&Exemplar=1&LAN=DE A1 Marek, Juraj A1 Pobegen, Gregor A1 Grossner, Ulrike PB Trans Tech Publications Ltd YR 2023 T3 Scientific Books Collection, Vol. 56 SN 3036411674 SN 9783036411675 SN 3036401679 SN 9783036401676 K1 Silicon carbide K1 Silicon-carbide thin films K1 Basal Plane Dislocation K1 Chemical Vapor Deposition K1 Crystal K1 Defect Inspection K1 Diode K1 Dislocation K1 Doping K1 Electrical Properties K1 Epitaxial Growth K1 Etching K1 High Power Device K1 Implantation K1 Integrated Circuit K1 JFET K1 Laser Annealing K1 MOSFET K1 Passivation K1 Point Defect K1 Reliability K1 Schottky Diode K1 Silicon Carbide K1 Star-Defect K1 Substrate K1 Thin Film K1 Wafer K1 Couches minces de carbure de silicium K1 Electric properties LK http://dx.doi.org/https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=3622908 DO https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=3622908 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)