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1 Ergebnisse
1
Instability Assessment of AlGaN/GaN High Electron Mobility ..:
, In:
2022 Asia-Pacific Microwave Conference (APMC)
,
Amir, Walid
;
Shin, Ju-Won
;
Chakraborty, Surajit
... - p. 184-186 , 2022
Link:
https://doi.org/10.23919/APMC55665.2022.10000060
RT T1
2022 Asia-Pacific Microwave Conference (APMC)
: T1
Instability Assessment of AlGaN/GaN High Electron Mobility Transistors Under High Drain Current Condition
UL https://suche.suub.uni-bremen.de/peid=ieee-10000060&Exemplar=1&LAN=DE A1 Amir, Walid A1 Shin, Ju-Won A1 Chakraborty, Surajit A1 Shin, Ki-Yong A1 Hoshi, Takuya A1 Tsutsumi, Takuya A1 Sugiyama, Hiroki A1 Kwon, Hyuk-Min A1 Kim, Tae-Woo YR 2022 K1 Degradation K1 HEMTs K1 Threshold voltage K1 Wide band gap semiconductors K1 MODFETs K1 Transient analysis K1 Integrated circuit reliability K1 AlGaN/GaN HEMT K1 Interface degradation K1 Constant voltage stress K1 Power-law kinetics K1 Current gain cutoff frequency (fT) K1 Unilateral gain cutoff frequency (fmax) K1 Transconductance (Gm) SP 184 OP 186 LK http://dx.doi.org/https://doi.org/10.23919/APMC55665.2022.10000060 DO https://doi.org/10.23919/APMC55665.2022.10000060 SF ELIB - SuUB Bremen
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