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1
Characterization of QST substrates at mm-wave frequencies:
, In:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)
,
Rotaru, Mihai D.
;
Bhaskar, Vignesh S.
;
Bera, Lakshmi K.
.. - p. 203-207 , 2022
Link:
https://doi.org/10.1109/EPTC56328.2022.10013166
RT T1 <cTitle>2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)</cTitle>: T1 <Title>Characterization of QST substrates at mm-wave frequencies</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10013166&Exemplar=1&LAN=DE A1 Rotaru, Mihai D. A1 Bhaskar, Vignesh S. A1 Bera, Lakshmi K. A1 Singh, Navab A1 Han, Michael K. YR 2022 K1 Semiconductor device measurement K1 Insertion loss K1 Transmission line measurements K1 Loss measurement K1 Coplanar waveguides K1 Substrates K1 Electronics packaging SP 203 OP 207 LK http://dx.doi.org/https://doi.org/10.1109/EPTC56328.2022.10013166 DO https://doi.org/10.1109/EPTC56328.2022.10013166 SF ELIB - SuUB Bremen
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