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1 Ergebnisse
1
Comprehensive study on effect of chip layout and mold thick..:
, In:
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)
,
Lim, Sharon Pei Siang
;
Chong, Ser Choong
;
Seit, Wen Wei
... - p. 945-950 , 2022
Link:
https://doi.org/10.1109/EPTC56328.2022.10013169
RT T1
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)
: T1
Comprehensive study on effect of chip layout and mold thickness on die shift and warpage for FOWLP applications
UL https://suche.suub.uni-bremen.de/peid=ieee-10013169&Exemplar=1&LAN=DE A1 Lim, Sharon Pei Siang A1 Chong, Ser Choong A1 Seit, Wen Wei A1 Soh, Jacob Jordan A1 Tippabhotla, Sasi Kumar A1 Rao, Vempati Srinivasa YR 2022 K1 Semiconductor device modeling K1 Radio frequency K1 Performance evaluation K1 Fabrication K1 Costs K1 Layout K1 Packaging SP 945 OP 950 LK http://dx.doi.org/https://doi.org/10.1109/EPTC56328.2022.10013169 DO https://doi.org/10.1109/EPTC56328.2022.10013169 SF ELIB - SuUB Bremen
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