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1 Ergebnisse
1
Automated Transfer Learning Model for Counterfeit IC Detect..:
, In:
2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)
,
Bhure, Chaitanya Mukund
;
Nicholas, Geraldine Shirley
;
Ghosh, Shajib
.. - p. 1-7 , 2022
Link:
https://doi.org/10.1109/PAINE56030.2022.10014980
RT T1
2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)
: T1
Automated Transfer Learning Model for Counterfeit IC Detection
UL https://suche.suub.uni-bremen.de/peid=ieee-10014980&Exemplar=1&LAN=DE A1 Bhure, Chaitanya Mukund A1 Nicholas, Geraldine Shirley A1 Ghosh, Shajib A1 Zhong, Yadi A1 Saqib, Fareena YR 2022 K1 Training K1 Analytical models K1 Computational modeling K1 Transfer learning K1 Supply chains K1 Training data K1 Predictive models K1 Supply chain K1 IC counterfeit K1 Image Augmentation SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/PAINE56030.2022.10014980 DO https://doi.org/10.1109/PAINE56030.2022.10014980 SF ELIB - SuUB Bremen
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