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Towards the Development of an Acne-Scar Risk Assessment Too..:

, In: 2022 IEEE International Autumn Meeting on Power, Electronics and Computing (ROPEC),
Aguilar, Jordan ; Benitez, Diego ; Perez, Noel... - p. 1-6 , 2022
Link: https://doi.org/10.1109/ROPEC55836.2022.10018763