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1 Ergebnisse
1
Mitigating Impact of Defects On Performance with Classical ..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Kotlyar, R.
;
Premaratne, S.
;
Zheng, G.
... - p. 8.4.1-8.4.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019382
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Mitigating Impact of Defects On Performance with Classical Device Engineering of Scaled Si/SiGe Qubit Arrays</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019382&Exemplar=1&LAN=DE A1 Kotlyar, R. A1 Premaratne, S. A1 Zheng, G. A1 Corrigan, J. A1 Pillarisetty, R. A1 Neyens, S. A1 Zietz, O. A1 Watson, T. A1 Luthi, F. A1 Borjans, F. A1 Lampert, L. A1 Henry, E. A1 George, H. A1 Bojarski, S. A1 Roberts, J. A1 Matsuura, A. Y. A1 Clarke, J. S. YR 2022 SN 2156-017X K1 Perturbation methods K1 Quantum dots K1 Qubit K1 Logic gates K1 Extraterrestrial measurements K1 Silicon K1 Dielectrics SP 8.4.1 OP 8.4.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019382 DO https://doi.org/10.1109/IEDM45625.2022.10019382 SF ELIB - SuUB Bremen
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