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New insights on the excess 1/f noise at cryogenic temperatu..:

, In: 2022 International Electron Devices Meeting (IEDM),
Asanovski, R. ; Grill, A. ; Franco, J.... - p. 30.5.1-30.5.4 , 2022
Link: https://doi.org/10.1109/IEDM45625.2022.10019388