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1 Ergebnisse
1
Deep insights into the Interplay of Polarization Switching,..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Wang, Xiaolin
;
Sun, Chen
;
Zheng, Zijie
... - p. 13.3.1-13.3.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019390
RT T1
2022 International Electron Devices Meeting (IEDM)
: T1
Deep insights into the Interplay of Polarization Switching, Charge Trapping, and Soft Breakdown in Metal-Ferroelectric-Metal-Insulator-Semiconductor Structure: Experiment and Modeling
UL https://suche.suub.uni-bremen.de/peid=ieee-10019390&Exemplar=1&LAN=DE A1 Wang, Xiaolin A1 Sun, Chen A1 Zheng, Zijie A1 Jiao, Leming A1 Zhou, Zuopu A1 Zhang, Dong A1 Liu, Gan A1 Kong, Qiwen A1 Zhang, Jishen A1 Xu, Haiwen A1 Han, Kaizhen A1 Kang, Yuye A1 Liu, Long A1 Gong, Xiao YR 2022 SN 2156-017X K1 Semiconductor device modeling K1 MOSFET K1 Analytical models K1 Electric breakdown K1 Switches K1 Market research K1 Ions SP 13.3.1 OP 13.3.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019390 DO https://doi.org/10.1109/IEDM45625.2022.10019390 SF ELIB - SuUB Bremen
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