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1 Ergebnisse
1
New Insights into the Impact of Hydrogen Evolution on the R..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Kong, Qiwen
;
Liu, Gan
;
Sun, Chen
... - p. 30.2.1-30.2.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019394
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>New Insights into the Impact of Hydrogen Evolution on the Reliability of IGZO FETs: Experiment and Modeling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019394&Exemplar=1&LAN=DE A1 Kong, Qiwen A1 Liu, Gan A1 Sun, Chen A1 Zheng, Zijie A1 Zhang, Dong A1 Zhang, Jishen A1 Xu, Haiwen A1 Liu, Long A1 Zhou, Zuopu A1 Jiao, Leming A1 Wang, Xiaolin A1 Han, Kaizhen A1 Kang, Yuye A1 Nguyen, Bich-Yen A1 Ni, Kai A1 Gong, Xiao YR 2022 SN 2156-017X K1 Temperature measurement K1 Temperature sensors K1 Temperature distribution K1 Field effect transistors K1 NIST K1 Mathematical models K1 Data models SP 30.2.1 OP 30.2.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019394 DO https://doi.org/10.1109/IEDM45625.2022.10019394 SF ELIB - SuUB Bremen
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