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18nm FDSOI Enhanced Device Platform for ULP/ULL MCUs:

, In: 2022 International Electron Devices Meeting (IEDM),

Weber, Olivier ; Min, Doohong ; Villaret, Alexandre... - p. 27.2.1-27.2.4 , 2022

Link: https://doi.org/10.1109/IEDM45625.2022.10019397

RT 
T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>18nm FDSOI Enhanced Device Platform for ULP/ULL MCUs</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10019397&Exemplar=1&LAN=DE
				
A1 Weber, Olivier
A1 Min, Doohong
A1 Villaret, Alexandre
A1 Park, Jinha
A1 Lee, Ilmin
A1 Vandenbossche, Eric
A1 Kim, Dohun
A1 Yun, Jiyoung
A1 Park, Jinwoo
A1 Lee, Minuk
A1 Kang, Jinseok
A1 Lee, Hyunjong
A1 Choi, Youngju
A1 Kim, Inhwan
A1 Kim, Joochan
A1 Kedar, Dhori
A1 Janardan, Dhori Kedar
A1 Haendler, Sebastien
A1 Elghouli, Salim
A1 Puget, Sophie
A1 Bernicot, Christophe
A1 Bernard, Emilie
A1 Wacquant, Francois
A1 Nimsgern, Fabien
A1 Choi, Joonhyuk
A1 Maeda, Shigenobu
A1 Lee, Jongho
A1 Arnaud, Franck
YR 2022
SN 2156-017X
K1 Performance evaluation
K1 Technological innovation
K1 Low voltage
K1 Field effect transistors
K1 Silicon-on-insulator
K1 Random access memory
K1 Logic gates
SP 27.2.1
OP 27.2.4
LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019397
DO https://doi.org/10.1109/IEDM45625.2022.10019397
SF ELIB - SuUB Bremen

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