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1 Ergebnisse
1
Simulation Methods of Multi-physics Effects in Nano-scale C..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Liu, Xiaoyan
;
Fan, Mengqi
;
Hu, Yuanzhao
... - p. 15.4.1-15.4.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019403
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Simulation Methods of Multi-physics Effects in Nano-scale CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019403&Exemplar=1&LAN=DE A1 Liu, Xiaoyan A1 Fan, Mengqi A1 Hu, Yuanzhao A1 Li, Haoling A1 Liu, Fei A1 Kang, Jinfeng YR 2022 SN 2156-017X K1 Semiconductor device modeling K1 Degradation K1 Electron traps K1 Integrated circuit interconnections K1 Nanoscale devices K1 Integrated circuit modeling K1 Integrated circuit reliability SP 15.4.1 OP 15.4.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019403 DO https://doi.org/10.1109/IEDM45625.2022.10019403 SF ELIB - SuUB Bremen
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