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1 Ergebnisse
1
A SPAD Depth Sensor Robust Against Ambient Light: The Impor..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Shimada, S.
;
Otake, Y.
;
Yoshida, S.
... - p. 37.3.1-37.3.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019414
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>A SPAD Depth Sensor Robust Against Ambient Light: The Importance of Pixel Scaling and Demonstration of a 2.5μm Pixel with 21.8% PDE at 940nm</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019414&Exemplar=1&LAN=DE A1 Shimada, S. A1 Otake, Y. A1 Yoshida, S. A1 Jibiki, Y. A1 Fujii, M. A1 Endo, S. A1 Nakamura, R. A1 Tsugawa, H. A1 Fujisaki, Y. A1 Yokochi, K. A1 Iwase, J. A1 Takabayashi, K. A1 Maeda, H. A1 Sugihara, K. A1 Yamamoto, K. A1 Ono, M. A1 Ishibashi, K. A1 Matsumoto, S. A1 Hiyama, H. A1 Wakano, T. YR 2022 SN 2156-017X K1 Fill factor (solar cell) K1 Electric breakdown K1 Image edge detection K1 Optical device fabrication K1 Layout K1 Optical sensors K1 Single-photon avalanche diodes SP 37.3.1 OP 37.3.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019414 DO https://doi.org/10.1109/IEDM45625.2022.10019414 SF ELIB - SuUB Bremen
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