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1 Ergebnisse
1
Extremely high performance, high density 20nm self-selectin..:
, In:
2022 International Electron Devices Meeting (IEDM)
,
Hong, Seokman
;
Choi, Hyejung
;
Park, Jaehyuk
... - p. 18.6.1-18.6.4 , 2022
Link:
https://doi.org/10.1109/IEDM45625.2022.10019415
RT T1 <cTitle>2022 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Extremely high performance, high density 20nm self-selecting cross-point memory for Compute Express Link</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10019415&Exemplar=1&LAN=DE A1 Hong, Seokman A1 Choi, Hyejung A1 Park, Jaehyuk A1 Bae, Yoonchel A1 Kim, Kyusung A1 Lee, Wootae A1 Lee, Seungyoon A1 Lee, Hyungdong A1 Cho, Seongrae A1 Ahn, Joonkoo A1 Kim, Seiyon A1 Kim, Taehoon A1 Na, Myunghee A1 Cha, Seonyong YR 2022 SN 2156-017X K1 Phase change materials K1 Technological innovation K1 Power demand K1 Three-dimensional displays K1 Scalability K1 Memory management K1 Reliability SP 18.6.1 OP 18.6.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45625.2022.10019415 DO https://doi.org/10.1109/IEDM45625.2022.10019415 SF ELIB - SuUB Bremen
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